Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics - Original PDF
نویسندگان: Sunil P. Khatri, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli
خلاصه: This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires.